- Precision Measurement
- Atomic Force Microscopes
- Measurement equipment
- CMM has ‘light’ touch
- View Eng. offers portable measuring system
- Optical Gaging Products Inc.
- ZOLLER genius 3 micro
- Advanced Diamond Technologies rolls out all-diamond AFM probes
- Borescopes in flexible, semirigid styles
- Optical and contact scanning for small, complex parts
- Process monitoring system
- New thread inspection system
- Micro/nano CMM for 3-D objects
- Carl Zeiss celebrates 90 years of industrial metrology
- QC microscope offers 3-D nanotopography analysis
- New benchtop vibration isolation system
- Xpress Precision’s new submicron probes
- Meggitt’s new ultra-thin, absolute-pressure transducer
- New Zeiss metrology distributor: Crescent Gage and Tool
- Industrial CT scanning service available
- New rotary table for Zeiss measuring machine
- MEMS piezoresistive sensing die
- Compact measuring machine
- Carl Zeiss surpasses 5,000 CT service scans
- Nondestructive internal inspection
- Gradient Lens’ borescope captures video images
- Schmitt Measurement Systems offers portable µScan System
